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Nano indentation & Micro scratch platform - CSM Instruments

The instrument is extremely compact and specifically designed for mechanical hardness testing. It can be configured with different motorized or manual sample stages. The nanoindentation is also upgradeable with optional technical features like Sinus mode (Dynamic Mechanical Analysis: storage and loss modulii) and can be configured with a range of displacement stage options and integrated video microscope.

  • Maximum Load        500 mN
  • Load Resolution      0.04 mN
  • Maximum Depth      200 µm
  • Depth Resolution    0.04 nm

The TTX comprises an extremely cost effective yet multi-mode nanoindentation system providing many testing configurations:

- Simple indentation 
- Advanced indentation
- Progressive multi cycles
- Continuous Multi Cycles (CMC)
- User-defined sequence
- Sinus mode

The Nanoindentation Tester includes a control unit, and a PC with full data acquisition, analysis and storage software. Display of data and HMI is provided by a dual 17" LCD monitor.

The Micro Scratch Tester is a module mounted on the nanoindentation platform. It allows to characterize the adhesion failure and delamination of thin films and coatings, with a typical thickness below 5 µm. The MST is also used in the analysis of organic and inorganic; soft and hard coatings. Substrates may be hard or soft, including metal alloys, semiconductors, glass, refractive and organic materials.

  • Load Range                          30 mN-30 N
  • Load Speed                          0.4-600 mm/min
  • Lenght of Scratch                 10 µm-20mm
  • Maximum Friction Force     30 N
  • Maximum Depth                 1 mm
  • Diamond stylus
  • Automated optical microscopic inspection
  • Feedback controlled force actuator
  • Scratch depth measurement
  • Surface profiling
  • y-direction swinging mode option
  • High resolution Video, Conscan and AFM viewing
  • Wide range of indenter tips
  • Indentation testing option
  • Temperature staging

piattaforma nanoindentatore-microscratch-ottica


piattaforma nanoindentatore-microscratch-ottica_particolare



High temperature tribometer - CSM Instruments

The instrument allows to measure friction forces, friction coefficients, wear rate as a function of the sliding velocity in a pin-on-disk or ball-on-disk configuration.

  • Rotation Speed              0.3-500 rpm
  • Load Range                    up to 60 N
  • Frictional Force             up to 20 N
  • Temperature                  20-1000°C
  • Precisely calibrated friction and wear measurements at elevated temperatures up to 1000°C
  • Efficient heating/cooling system to accurately maintain desired test temperature
  • High thermal stability
  • Automatic shut-off at selected track length or friction coefficient threshold
  • Test in liquids, within their thermal stability range
  • Testing conforms to DIN 50324, ASTM G99 and ASTM G133.

Powerful software package for PC-controlled data acquisition and instrument control, featuring real-time graphical data display, calculation of Hertzian pressures, friction and wear coefficients, sliding lifetime, etc..

Tests can be carried out according to standards DIN 50324, ASTM G99 and ASTM G133.

tribometro alta temperatura




 Atomic Force Microscope - NTEGRA Prima - NT-MDT


The device is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, in liquids, in controlled environment and on site with frequencies up to 5MHz.
There are several scanning types implemented in device: scanning by the sample, scanning by the probe and dual-scanning.

Built-in three axes closed loop control sensors trace the real displacement of the scanner and compensate unavoidable imperfections of piezoceramics as non-linearity, creep and hysteresis. The sensors, which are used by NT-MDT, have the lowest noise level, thus allowing working with closed loop control on the very small fields (down to 10x10 nm). This is especially valuable for carrying out nanomanipulation and lithography modes.

The instrument has a built-in optical system with 1 µm resolution, which allows imaging the scanning process in real-time.

Due to the open architecture, it is specialized for magnetic measurements with external magnetic field, high-temperature experiments, Near-field optical microscopy, Raman spectroscopy, etc.

  • Closed loop control with the lowest noise level (can be used for scanning fields of <100 nm)
  • Optical microscope with the resolution of 1µm
  • Scanning by sample (the lowest noise level, the best resolution on the small fields), scanning by probe (maximum scanning range, working with large samples)
  • More than 40 measuring modes, including unique ones
  • Carrying out experiments in air, in liquids, in controlled environment

The main operative modes are:

  • contact AFM/ LFM (also in STM contact SCM mode in liquid)
  • ResonantMode (semicontact (also in STM contact SCM mode in liquid) + noncontact AFM) 
  • Phase Imaging (also in STM contact SCM mode in liquid)
  • Force Modulation (viscoelastisity) (also in STM contact SCM mode in liquid)
  • MFM/ EFM 
  • Adhesion Force Imaging (also in STM contact SCM mode in liquid)
  • AFM Lithography-Force (also in STM contact SCM mode in liquid)
  • Spreading Resistance Imaging (SRI)
  • AFM Lithography-Voltage
  • Scanning Capacitance Imaging (SCI)
  • Scanning Kelvin probe microscopy(SKM)

afm lab




scansione afm


High speed camera - pco.camera

This high speed 10 bit CMOS camera system comprises advanced CMOS and electronics technology. With the new approach to integrate the image memory (camRAM) into the camera itself, it enables unmatched fast image recording with 820 MB/s. The system features an excellent resolution (1280 x 1024 pixel) and low noise. It consists of a compact camera with an external intelligent power supply. The image data are transferred via customer selectable standard data interfaces to a computer (IEEE 1394 (“firewire”), camera link). The available exposure times range from 1 µs to 5 s. This digital CMOS camera system is perfectly suited for high speed camera applications such as material testing, external crash testing or super slow motion movie clips.

  • Resolution                        1280x1024 pixel
  • Pixel Size                          12.0x12.0 µm2
  • Dinamic Range A/D         10 bit
  • Frame Rate@full frame-501fps@1280x480-1068fps
  • Exposure Time                 1 µs - 1 s
   high speed camera            


High performance parallel computing system

The HPC system comprises:

  • multiprocessor with n.4 Opteron 8439 Six-core CPUs, 2.8GHz, 3MB L2, 6MB L3 on the mother board to allow a parallel programming with OpenMP
  • Supermicro H8QMi-2 quad Opteron motherboard
  • 12x4GB PC2-5300 DDR2-667 SDRAM, Registered ECC
  • 250GB SATA 3Gb/s drive
  • 2nd HD: 250GB SATA 3Gb/s drive

Copyright © 2010 --- TriboLAB
DIMEG - Politecnico di Bari,  Viale Japigia, 182 - 70126 BARI (Italy)

Tel. +39 080 596 2746, Fax +39 080 596 2746/2777

Contact us at tribolab.poliba@gmail.com